Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis
نویسندگان
چکیده
منابع مشابه
Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis.
Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and app...
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ژورنال
عنوان ژورنال: Journal of Synchrotron Radiation
سال: 2017
ISSN: 1600-5775
DOI: 10.1107/s1600577516016568